北京介電常數(shù)測(cè)試儀生產(chǎn)廠家特點(diǎn)：
◎ 本公司創(chuàng)新的自動(dòng)Q值保持技術(shù)，使測(cè)Q分辨率至0.1Q，使tanδ分辨率至0.00005 。
◎ 能對(duì)固體絕緣材料在10kHz～120MHz介質(zhì)損耗角(tanδ)和介電常數(shù)(ε)變化的測(cè)試。
◎ 調(diào)諧回路殘余電感值低至8nH，保證100MHz的(tanδ)和(ε)的誤差較小。
◎ 特制LCD屏菜單式顯示多參數(shù)：Q值，測(cè)試頻率，調(diào)諧狀態(tài)等。
◎ Q值量程自動(dòng)/手動(dòng)量程控制。
◎ DPLL合成發(fā)生1kHz～60MHz, 50kHz～160MHz測(cè)試信號(hào)。獨(dú)立信號(hào) 源輸出口，所以本機(jī)又是一臺(tái)合成信號(hào)源。
◎ 測(cè)試裝置符合國(guó)標(biāo)GB/T 1409-2006,美標(biāo)ASTM D150以及IEC60250規(guī)范要求。
北京介電常數(shù)測(cè)試儀生產(chǎn)廠家主要技術(shù)指標(biāo)：
2.1 tanδ和ε性能：
2.1.1 固體絕緣材料測(cè)試頻率10kHz～120MHz的tanδ和ε變化的測(cè)試。
2.1.2 tanδ和ε測(cè)量范圍：
tanδ：0.1～0.00005，ε：1～50
2.1.3 tanδ和ε測(cè)量精度（1MHz）：
tanδ：±5%±0.00005，ε：±2%
工作頻率范圍：50kHz～50MHz 四位數(shù)顯，壓控振蕩器
Q值測(cè)量范圍：1～1000三位數(shù)顯，±1Q分辨率
可調(diào)電容范圍：40～500 pF ΔC±3pF
電容測(cè)量誤差：±1%±1pF
Q表殘余電感值：約20nH
振蕩頻率
a．振蕩頻率范圍：25kHz～50MHz；
b．頻率分檔：
25～74kHz， 74～213kHz， 213-700kHz， 700kHz～1.95MHz，
1.95MHz～5.2MHz， 5.2MHz～17MHz， 17～50MHz。
c．頻率誤差：2×10±1個(gè)字。
Q合格指示預(yù)置功能，預(yù)置范圍：5～999。
介質(zhì)損耗和介電常數(shù)是各種電瓷、裝置瓷、電容器等陶瓷，還有復(fù)合材料等的一項(xiàng)重要的物理性質(zhì)，通過(guò)測(cè)定介質(zhì)損耗角正切tanδ及介電常數(shù)（ε），可進(jìn)一步了解影響介質(zhì)損耗和介電常數(shù)的各種因素，為提高材料的性能提供依據(jù)；儀器的基本原理是采用高頻諧振法，并提供了，通用、多用途、多量程的阻抗測(cè)試。它以單片計(jì)算機(jī)作為儀器的控制，測(cè)量核心采用了頻率數(shù)字鎖定，標(biāo)準(zhǔn)頻率測(cè)試點(diǎn)自動(dòng)設(shè)定，諧振點(diǎn)自動(dòng)搜索，Q值量程自動(dòng)轉(zhuǎn)換，數(shù)值顯示等新技術(shù)，改進(jìn)了調(diào)諧回路，使得調(diào)諧測(cè)試回路的殘余電感減至zui低，并保留了原Q表中自動(dòng)穩(wěn)幅等技術(shù)，使得新儀器在使用時(shí)更為方便，測(cè)量值更為精確。儀器能在較高的測(cè)試頻率條件下，測(cè)量高頻電感或諧振回路的Q值，電感器的電感量和分布電容量，電容器的電容量和損耗角正切值，電工材料的高頻介質(zhì)損耗，高頻回路有效并聯(lián)及串聯(lián)電阻，傳輸線(xiàn)的特性阻抗等。該儀器用于科研機(jī)關(guān)、學(xué)校、工廠等單位對(duì)無(wú)機(jī)非金屬新材料性能的應(yīng)用研究。
Dielectric constant and dielectric loss tester features:
Automatic Q / / the company's innovative value keeping technology, the resolution of Q to 0.1Q, the resolution to 0.00005 tan.
Can the solid insulating materials in the dielectric loss angle of 10kHz ~ 120MHz (tan delta) and Permittivity (epsilon) change test.
The tuning circuit of residual low inductance to guarantee 8nH, 100MHz (Tan d) and (E) the error is small.
The special multi parameter LCD screen menu display: Q value, test frequency tuning etc..
The Q value range automatic / manual range control.
The synthesis of DPLL 1kHz ~ 60MHz, 50kHz ~ 160MHz test signal. Independent signal source output, so the machine is a synthetic signal source.
The test device complies with GB/T 1409-2006, ASTM D150 and IEC60250 American Standard specifications.
The main technical indexes of dielectric constant and dielectric loss tester:
2.1 Tan D and E performance:
2.1.1 solid insulating materials test frequency 10kHz ~ tan delta and epsilon 120MHz change test.
2.1.2 tan delta and epsilon measurement range:
Tan 8: 0.1 ~ 0.00005, 1 ~ 50.
2.1.3 tan delta and epsilon precision (1MHz):
Tan 8: + 5% + 0.00005 + 2% epsilon:
Operating frequency range: 50kHz ~ 50MHz four digit digital display, voltage controlled oscillator
Q value measurement range: 1000 ~ three 1 digit display, + 1Q resolution
Adjustable capacitance range: 40 ~ 500 pF C + 3pF
Capacitance measurement error: + 1% + 1pF
Q table residual inductance value: about 20nH
oscillation frequency
A. frequency range: 25kHz ~ 50MHz;
B. frequency shift:
25 ~ 74kHz, 74 ~ 213kHz, 213-700kHz, 700kHz ~ 1.95MHz,
1.95MHz ~ 5.2MHz, 5.2MHz ~ 17MHz, 17 ~ 50MHz.
C. frequency error: 2 * 10 + 1 words.
ualified preset indication function, the preset range: 5 ~ 999.
Dielectric loss and dielectric constant is a variety of porcelain, porcelain device, capacitor, etc. ceramic and composite materials, such as an important physical properties, by measuring the dielectric loss angle tan delta and dielectric permittivity (epsilon), further understanding of the factors in the influence of dielectric loss and dielectric constant, in order to improve the properties of materials provides the basis; equipment and the basic principle is using high frequency resonance method, and provides, GM, multi-purpose, multi range impedance test. It to single chip computer as the instrument control, core measurements using digital frequency locking, frequency standard test point automatic setting, resonant point automatic search, Q value range automatic conversion, numerical display and other new technologies, improved the tuning circuit, so as to reduce to a minimum the tuning circuit for testing residual inductance and retains the original Q table in the automatic amplitude stabilizer technology, makes the new instrument in use is more convenient and the measured values are accurate. The instrument can under high frequency test conditions, measurement of high frequency inductive or resonant loop of the Q value, inductance and distributed capacitance of inductor, capacitor of capacitance and loss angle tangent value, electrical materials, dielectric loss in high frequency and high frequency circuit in parallel and series resistance, transmission line characteristic impedance. The application of scientific research institutions, schools, factories and other units of the new material properties of inorganic non metal for the instrument.
